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[1]汪 洋*.GaN基材料中V型缺陷对LED光电性能的影响[J].厦门大学学报(自然科学版),2018,57(03):383-389.[doi:10.6043/j.issn.0438-0479.201707003]
 WANG Yang*.Effects of V-defects in GaN-based Materals on LED Photoelectic Property[J].Journal of Xiamen University(Natural Science),2018,57(03):383-389.[doi:10.6043/j.issn.0438-0479.201707003]
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GaN基材料中V型缺陷对LED光电性能的影响(PDF/HTML)
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《厦门大学学报(自然科学版)》[ISSN:0438-0479/CN:35-1070/N]

卷:
57卷
期数:
2018年03期
页码:
383-389
栏目:
研究论文
出版日期:
2018-05-31

文章信息/Info

Title:
Effects of V-defects in GaN-based Materals on LED Photoelectic Property
文章编号:
0438-0479(2018)03-0383-07
作者:
汪 洋12*
1.厦门大学半导体光电材料及其高效转换器件协同创新中心,福建 厦门 361005; 2.厦门乾照光电股份有限公司,福建 厦门 361101
Author(s):
WANG Yang12*
1.Collaborative Innovation Center for Optoelectronic Semiconductors and Efficient Device,Xiamen University,Xiamen 361005,China; 2.Xiamen Changelight Co.,Ltd,Xiamen 361101,China
关键词:
GaN 发光二极管 V型缺陷
Keywords:
GaN LED V-defect
分类号:
O 472
DOI:
10.6043/j.issn.0438-0479.201707003
文献标志码:
A
摘要:
发光效率是LED器件的核心指标,为了提升GaN-LED的发光效率,研究了具有不同V型缺陷密度的材料与器件的光致发光及电致发光特性,分析了影响发光效率的因素,研究发现V型缺陷一方面通过提升载流子(特别是空穴)注入效率而改善发光效率,另一方面又会通过减少有效发光面积而降低发光效率,这一竞争机制共同影响具有V型缺陷结构的GaN-LED的发光效率.结果表明,尺寸为0.25 mm×0.75 mm的芯片在150 mA驱动条件下,随着V型缺陷密度的增加,发光功率和外量子效率先上升后下降.对于最优化缺陷密度(4.2×108 cm-2)的样品,其发光功率和外量子效率分别为183.5 mW和45.0%,较最小缺陷密度(1.7×108 cm-2)样品的发光功率172.2 mW和外量子效率42.2%,均约提升6.6%.
Abstract:
Luminescence efficiency is one of the key indicators of LEDs.For improving the luminescence efficiency of GaN-LEDs,photoluminescence and electroluminescencecharacteristics of materials and devices with various V-defect densities are studied.One competitive mechanism is revealed.In one hand,the injection efficiency promotion of carriers(hole mainly)due to the increased V-defectdensity results in the increase of luminescence efficiency.On the other hand,the area decrease of the active region due to the increased V-defectdensity leads to the decrease of luminescence efficiency.LED chips are fabricated with identical size of 0.25 mm×0.75 mm,and are drived at the current of 150 mA.With the increase of the V-defect density,the light output and the external quantum efficiency are improved first and then decreased.The best light output and external quantum efficiency of chips with the V-defect density of 4.2×108 cm-2are shown as 183.5 mW and 45.0% respectively,which are 6.6% better than those of 172.2 mW and 42.2% of chips with un-optimized V-defect density of 1.7×108 cm-2.

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备注/Memo

备注/Memo:
收稿日期:2017-07-06 录用日期:2018-01-17
*通信作者:wangyang@changelight.com.cn
引文格式:汪洋.GaN基材料中V型缺陷对LED光电性能的影响[J].厦门大学学报(自然科学版),2018,57(3):383-389.
Citation:WANG Y.Effects of V-defects in GaN-based materals on LED luminescence efficiency[J].J Xiamen Univ Nat Sci,2018,57(3):383-389.(in Chinese)
更新日期/Last Update: 1900-01-01